OPTIMIZATION OF DAMAGED CORN KERNEL RECOGNITION ALGORITHM BASED ON A DUAL-LIGHT SYSTEM
基于双光系统的破损玉米籽粒识别算法优化
DOI : https://doi.org/10.35633/inmateh-75-67
Authors
Abstract
In corn processing, threshed kernels often accumulate on dimly lit conveyor belts, leading to challenges in identifying damaged kernels. This study designed a sampling device integrating top and backlighting to explore optimal detection conditions. By comparing four datasets (top-lighting-dispersed, top-lighting-aggregated, backlighting-dispersed, and backlighting-aggregated), the highest accuracy (79.6%) was achieved under backlighting-dispersed conditions, validating its practicality. Furthermore, a lightweight optimization strategy was proposed for the YOLOv8 algorithm: introducing Ghost convolution to reduce computational redundancy, integrating attention mechanisms to enhance feature extraction of damaged regions, and replacing standard convolutions with depth wise separable convolutions in the backbone network. The optimized YOLOv8n_gcd model reduced floating-point operations (FLOPs) by 24%, improved inference speed (FPS) by 165%, and demonstrated enhanced robustness in densely stacked kernel scenarios. This research provides an efficient, low-cost, and adaptive solution for intelligent agricultural quality inspection, with both theoretical significance and practical engineering potential.
Abstract in Chinese