WHEAT GRAIN APPEARANCE QUALITY DETECTION BASED ON IMPROVED YOLOV8N
基于改进YOLOV8N的小麦籽粒外观品质检测
DOI : https://doi.org/10.35633/inmateh-75-30
Authors
Abstract
Wheat grains are a common type of cereal variety, and due to their large quantity and high demand, traditional manual quality inspection requires a significant amount of labor with potentially inadequate results. To address this issue, this study focuses on intact, damaged, moldy, and shriveled wheat grains, and establishes a YOLO-wheat automatic wheat grain appearance quality detection model. First, a large number of wheat grain sample images were collected, preprocessed, and annotated. Next, YOLOv5n, YOLOv8n, and YOLOv10n wheat grain object detection models were established, and the optimal model YOLOv8n was selected as the base model for automatic wheat grain appearance quality detection. To further improve wheat grain detection performance, the Dilation-wise Residual (DWR) module was integrated into the YOLOv8n network structure to enhance feature extraction from the expandable receptive field in the higher layers of the network. Additionally, the TripletAttention attention mechanism was introduced, and this improved network was named YOLO-wheat. Experimental results showed that YOLO-wheat achieved an mAP value of 91.3% in wheat grain appearance quality detection, representing a 4.3% improvement compared to the previous version. This study provides technical support for automatic wheat quality detection.
Abstract in English